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Technical Documentation

Chemical analysis: X-ray fluorescence spectroscopy

Principle : The x-ray fluorescence (xrf) is a non-destructive, which is used to quantify the elemental composition of solid samples and liquids.

The sample to be analyzed is placed under a beam of x-rays under the effect of these x-rays, the atoms in the sample move from their ground state to an excited state. the excited state is unstable, the atoms tend to return to the ground state by releasing energy in the form of x-ray photon in particular. every atom, having an electronic configuration clean, will emit photons of energy and wavelength-specific. this is the phenomenon of x-ray fluorescence which is a secondary emission of x-rays characteristic of the atoms that constitute the sample. the analysis of this x-ray radiation, secondary to the time to get to know the nature of the chemical elements present in a sample as well as their mass concentration.

there are two systems xrf system, a dispersion of wavelength (wdxrf) system and an energy-dispersive (edxrf). the difference is the way in which x-rays are detected.

Interest/Objective:

The x-ray fluorescence spectroscopy is a technique of elemental analysis overall to identify and determine most of the chemical elements that make up a sample. this technique can be used for a variety of materials : minerals, ceramics, cements, metals, oils, water, glass… in solid or liquid form. it allows the analysis of all the chemical elements beryllium (be) to uranium (u) in the concentration ranges from a few ppm to 100%, with accurate results and above all reproducible.

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Raman spectroscopy

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Spectroscopy NMR

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Liquid chromatography

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AUGER spectroscopy

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Photoelectron microscopy

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X-ray fluorescence spectroscopy

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  • Chemical analysis: X-ray fluorescence spectroscopy
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